Local structure of plastic Ag2(S,Se,Te) thermoelectrics during deformation

Understanding plastic deformation mechanisms in ductile inorganic semiconductors is critical for advancing flexible electronics and thermoelectric technologies. This proposal seeks to probe atomic-scale structural evolution in ductile Ag2(S,Se,Te) thermoelectrics under tensile strain using in situ high-energy synchrotron total scattering (100 keV X-rays) at beamline ID15A. By analyzing pair distribution functions of annealed and as-prepared Ag2Te1-xSx (x=0.3,0.4) and Ag2S1/3Se1/3Te1/3 bulk samples, we will resolve the role of Ag-S bond dynamics in strain-induced amorphization and exceptional ductility. Overcoming limitations of conventional techniques prone to surface amorphization, this proposal will reveal the atomic scale origin on how annealing enhances plasticity, providing insights to engineer mechanically robust semiconductors for next-generation flexible devices.