Data for: Measuring the structure of defect clusters in (1-x)BiFeO3 - (x)BaTiO3 alloys with advanced electron microscopy and ptychography

Description of the data and file structure Each .zip archive contains the atomic resolution STEM image data and multislice electron ptychography data for the corresponding film compositions discussed in the main text. STEM image datasets consist of simultaneously acquired annular dark field (ADF, adf.tif) and integrated differential phase contrast (iDPC, idpc.tif) images. Ptychography datasets consist of four-dimensional scanning transmission electron microscopy dataset (.raw) and metadata (.xml) collected with EMPAD and corresponding multislice electron ptychography reconstruction outputs, including the probe, object, and engine parameters (.mat). Files and variables XXBFO-XXBTO (80BFO-20BTO.zip,90BFO-10BTO.zip) Images R# adf.tif - aligned ADF image idpc.tif - aligned iDPC image Ptychography acquisition_# acquisition_#.xml - standard EMPAD acquisition metadata file Niter300.mat - standard fold_slice reconstruction output containing reconstruction parameters, probe, and object. scan_x256_y256.raw - EMPAD 4D-STEM data which can be opened using the 4D-STEM Explorer app for macOS or other popular electron microscopy 4D-STEM software (e.g. py4DSTEM) Code/software Multislice electron ptychography is performed with the fold_slice fork (https://github.com/yijiang1/fold_slice) built on the Matlab code developed by the Science IT and the coherent X-ray scattering (CXS) groups at Paul Scherrer Institut, Switzerland: https://www.psi.ch/en/sls/csaxs/software. Copyright and licenses should follow their respective agreements.