Data for "Microstructural Evolution and Crystallization Behavior of Amorphous Medium‑Entropy Ti–Nb–Zr–Ag Thin Films"

This dataset provides the source data supporting the associated manuscript. It includes SEM and TEM/HRTEM microscopy images in .png format (used to prepare the figures) and XPS data exports in .csv format (survey and high-resolution spectra and processed analysis tables used to report surface composition). The files enable inspection of the original microscopy data and reproduction/verification of the reported XPS results using standard data-analysis software.