Data set associated with 'Magnetic Phases of Sputter Deposited Thin-Film Erbium'

We present a detailed structural and magnetic characterization of sputter deposited thin film erbium, determined by x-ray diffraction, transport measurements, magnetometry and neutron diffraction.This provides information on the onset and change of the magnetic state as a function of temperature and applied magnetic field. Many of the features of bulk material are reproduced, but of particular interest is the identification of a long-wavelength, c = 4=17, conical magnetic state not observed in any other thin film or bulk measurements. The data from the various techniques are combined to construct magnetic field, temperature (H; T){phase diagrams for the 200 nm-thick Er sample that serves as a foundation for future exploitation of this complex magnetic thin film system.