Elemental peak intensities in section halves were measured by an Avaatech X-ray fluorescence (XRF) Core Scanner postexpedition. Each measurement position may be measured at multiple XRF conditions in
This dataset is about: (Table 2) Physical properties of surface sediments from the Enisei section and Al and Si contents in their dry bulk matter. Please consult parent dataset @ https://doi.org/10.15
