Electron backscatter diffraction data sets used in this work. The files named 00, 03, 06, 09, 12 and 15.ctf are from the reference specimens, and the filenames represent the approximate nominal plasti
This study carried out the microstructural characterization, by light microscopy, of sintered SiC in the presence of liquid phase at temperatures of 1800, 1850 and 1900 ºC, added with Al2O3 and Y2O3 a
Fig.8. Microstructure analysis: (a) the morphologies of the four-pass FSPed AMCs, (b) the main element profiles by EDS line scan detection in (a), (c) EDS results of the marked point A in (a).
