Characterization of minimum material requirements for high-speed X-ray diffraction microscopy of operating Surface Acoustic Waves (SAW) devi

Exploiting X-ray diffraction microscopy (XDM), this proposal aims at extending our physical description of the wave behavior in a Surface Acoustic Wave (SAW) device. The expected comprehensive description will contribute to improve the understanding of the interaction between the acoustic waves in the piezoelectric material and in the substrate. This in turn will help develop new sensors as well as low loss resonators and filters for the next generation of telecommunication standards. This proposal builds upon the lessons learnt from the beamtime related to proposal ME-1648 and the in-house experiment BLC 15862 for thorough characterization of required material parameters which allow real-time imaging of SAWs at ID01