Poly-crystalline Silicon Panels Defect Segmentation Dataset
收藏IEEE2026-04-17 收录
下载链接：
https://ieee-dataport.org/documents/poly-crystalline-silicon-panels-defect-segmentation-dataset
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资源简介：
Practical dataset PSP-DS for polysilicon panel defect segmentation comes from a real industrial setting and contains 356 high-resolution images of 1 non-defect type and 7 defect categories. We precisely annotated 149 defect samples at the pixel level. PSPDS can be used to evaluate various methods such as unsupervised anomaly detection, few-shot segmentation, anomaly generation, and one-class classification.
提供机构：
Yao, Haiming
