Poly-crystalline Silicon Panels Defect Segmentation Dataset

Practical dataset PSP-DS for polysilicon panel defect segmentation comes from a real industrial setting and contains 356 high-resolution images of 1 non-defect type and 7 defect categories. We precisely annotated 149 defect samples at the pixel level. PSPDS can be used to evaluate various methods such as unsupervised anomaly detection, few-shot segmentation, anomaly generation, and one-class classification.