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Defects in Phase Change Materials: an XPCS Study

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ESRF Portal2028-01-01 更新2026-04-23 收录
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https://doi.esrf.fr/10.15151/ESRF-ES-2226533541
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资源简介:
Despite their significance in technological applications, the behavior of defects in amorphous and crystalline phase-change materials is not yet fully understood. To address this, we propose an X-ray Photon Correlation Spectroscopy (XPCS) study to examine the formation and evolution of photo-induced defects as a function of dose and exchanged momentum. This method has already demonstrated its effectiveness in studying defect dynamics in prototypical glasses.
提供机构:
Universita di Padova, Dipartimento di Fisica e Astronomia G Galilei, Via F Marzolo 8, 35131 Padova, Italy; Universita di Pisa, Dipartimento di Fisica, Largo B Pontecorvo 3, 56127 Pisa, Italy
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2028-01-01
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