Defects in Phase Change Materials: an XPCS Study

Despite their significance in technological applications, the behavior of defects in amorphous and crystalline phase-change materials is not yet fully understood. To address this, we propose an X-ray Photon Correlation Spectroscopy (XPCS) study to examine the formation and evolution of photo-induced defects as a function of dose and exchanged momentum. This method has already demonstrated its effectiveness in studying defect dynamics in prototypical glasses.