Improved Silicon Carbide Detector Characterisation for Chipir

The range of application of high band-gap solid state detectors is expanding in those environments where the high neutron flux is an issue, such as in the high-flux spallation neutron sources. Single-crystal Diamond (SD) detectors have been characterized in the past and they are currently installed at the ChipIr beam-line at ISIS as beam monitors. We are exploring the possibility of using SiC detectors as an alternative to SDs. After a successful test at the ROTAX beamline we tested it at ChipIR. Unfortunately, due to high count rate, the measurement is affected by pile up and must be performed again with a less efficient detector in order to test the detector stability duringneutron irradiation and then measure the CHIPIR neutron flux.