Pushing the Study of Point Defects in Thin Film Ferrites to Low Temperatures Using In Situ Ellipsometry
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https://zenodo.org/record/5723368
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资源简介：
Dataset for article "Pushing the Study of Point Defects in Thin Film Ferrites to Low Temperatures Using In Situ Ellipsometry" published in Adv. Mater. Interfaces 2021, 8, 2001881.
The data includes:
XRD data of La1-xSrxFeO3 thin films
Optical conductivity of LSF films as a function of oxygen partial pressure and Sr content
Concentration of electronic holes in LSF thin films as a function of oxygen partial pressure and temperature
Defect chemistry models employed for describing the concentration of point defects in LSF thin films.
Equilibrium constants for oxygen incorporation reactions in LSF thin films at different temperatures
Ellipsometry raw data of LSF50 thin film as a function of equivalent oxygen pressure
Electrochemical impedance spectra of the LSF50 thin film at 400 ºC
创建时间：
2021-11-25
