HRXRD DATA of NZFO film.csv
收藏Figshare2021-09-07 更新2026-04-08 收录
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https://figshare.com/articles/dataset/HRXRD_DATA_of_NZFO_film_csv/16578932/1
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资源简介：
In order to investigate the crystal structure and the crystallinequality of our PLD-grown and annealed thin films of NZFO, thehigh-resolution X-ray diffraction (HR-XRD) scan was executedemploying a Philips PANalytical X’Pert PRO diffractometer withCu Kα radiation (λ ̴1.542 Å). Typical symmetric θ–2θ scans were recorded between 20° and 60° with a step size of 0.03° at a scanning rate of 1° per minute.
提供机构：
Shit, Subhasis; Nath, Tapan Kumar; Maji, Nilay
创建时间：
2021-09-07
