Data for: Contactless determination of base resistivity on silicon wafers with highly doped surfaces
收藏Mendeley Data2019-06-12 更新2026-04-09 收录
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https://data.mendeley.com/datasets/73yt7m3c8n
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资源简介：
The database of the central result graph Fig. 4a) is covered by Reaserch_data_figure4a.
创建时间：
2019-06-12
