Data for: Contactless determination of base resistivity on silicon wafers with highly doped surfaces

Name: Data for: Contactless determination of base resistivity on silicon wafers with highly doped surfaces
Published: 2019-06-12T00:00:00+08:00

Mendeley Data2019-06-12 更新2026-04-09 收录

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资源简介：

The database of the central result graph Fig. 4a) is covered by Reaserch_data_figure4a.

创建时间：

2019-06-12

Data for: Contactless determination of base resistivity on silicon wafers with highly doped surfaces

资源简介：

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