Chemically destroyed depth d0 as a reliability process for parameters of log-normal distribution (μ, σ) with time influence.
收藏Figshare2019-03-07 更新2026-04-29 收录
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https://figshare.com/articles/dataset/Chemically_destroyed_depth_i_d_i_sub_0_sub_as_a_reliability_process_for_parameters_of_log-normal_distribution_i_i_i_i_with_time_influence_/7815476
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Chemically destroyed depth d0 as a reliability process for parameters of log-normal distribution (μ, σ) with time influence.
创建时间：
2019-03-07
