NEUTRON INDUCED SOFT ERRORS ON ELECTRONIC DEVICES

B2FIND2026-04-25 收录

辐射效应

电子器件可靠性

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https://b2find.eudat.eu/dataset/05923e19-0af7-525b-b4ec-005c6c52dae6 数据链接链接失效反馈

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Our research team would like to have the opportunity to investigate the effects of atmospheric neutrons on electronic devices. Our research interest is focused on the effects of...

纳米铁电围栅器件的抗总剂量辐照实验数据

纳米器件

辐射效应

该数据集主要面向纳米铁电围栅器件抗总剂量辐照特性研究，基于中国科学院微电子研究所和北京师范大学的电学测试平台和钴60γ射线辐照源等产生，主要记录了2023年3月至2024年11月期间的研究结果，包括实验数据和相关成果2个文件夹，数据总量36.6MB。主要内容包括总剂量辐照前后纳米铁电围栅器件转移特性曲线与数据，以及与研究内容相关的3篇论文与1项专利。

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RADNEXT TRANSNATIONAL ACCESS. Test Of Systems for Harsh Environment

辐射效应

设备可靠性

This proposal focuses on the evaluation of neutron-induced Single Event Effects (SEE) in COTS (Commercial Off-The-Shelf) devices and SoCs (System-on-Chip), which are of interest for critical applicati

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Room temperature structure of the ground state of AtPhot2LOV2 recorded after an accumulated dose of 354 kGy

生物分子结构

辐射效应

Room temperature structure of the ground state of AtPhot2LOV2 recorded after an accumulated dose of 354 kGy Descriptor: FLAVIN MONONUCLEOTIDE, Phototropin-2 Authors: Aumonier, S, Gotthard, G, Royant,

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Codes and data for "Unveiling the hidden warming layer: Metre-scale clear-sky radiative effects at stratocumulus cloud top"

大气科学

辐射效应

Codes and data for "Unveiling the hidden warming layer: Metre-scale clear-sky radiative effects at stratocumulus cloud top" Thermodynamic profiles are generated with the direct numerical simulation tl

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Understanding Radiation-induced Effects in State-of-the-Art Embedded Processors

辐射效应

嵌入式处理器

The susceptibility of electronic devices to atmospheric radiation is no longer just of concern to the aerospace industry. At sea level, a 100,000-device deployment can expect to experience a radiation

Mendeley Data2024-01-31 更新60

NEUTRON INDUCED SOFT ERRORS ON ELECTRONIC DEVICES

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