X- ray diffraction for nickel
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This dataset contain the XRD data for the prepared nickel, that synthesized via electrochemical deposition for the figures (2,3,4) in manuscript [Cold Plasma as a Novel Annealing Technique: A Comparative Study with Thermal Annealing on the Structural and Morphological Properties of Nickel and Iron Oxide]. Were measured using X-ray diffraction instrument from the Netherlands by Philips Company (PW1730).
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Zenodo创建时间：
2025-10-25
