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Data for Thermally activated defects in float zone silicon: Effect of nitrogen on the introduction of deep level states

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doi.org2025-03-23 收录
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http://doi.org/10.17632/jgwhkcj6c5.1
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资源简介:
Data behind graphs presented in "Thermally activated defects in float zone silicon: Effect of nitrogen on the introduction of deep level states" The dataset (provided as a single file in XLSX format) contains the data behind the graphs presented in the paper. Each worksheet within the spreadsheet relates to a single figure in the paper. Captions to the figures are given in the paper. Abbreviations, variables and methods used are defined in the paper.

本数据集(以单一 XLSX 格式文件提供)收录了论文中所展示图表背后的数据。电子表格中的每一张工作表均与论文中的单一图表相对应。图表的标题已在论文中给出。其中所使用的缩写、变量及方法均在论文中进行了定义。
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