X-ray diffraction (XRD) measurements were conducted using Empyrean Powder Diffractometer with a Cukα radiation and a Ni filter at constant voltage 40 kV, and 30 mA.
Color reflectance data were measured on section halves using an integration sphere and a UV-VIS spectrophotometer mounted on the Section Half Multisensor Logger (SHMSL). Spectral counts are recorded i
