X-ray data collection and crystal structure refinement statistics.
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1Values in parentheses correspond to the last resolution shell.2Rint = ∑h∑j | Ihj−h> |/∑h∑j Ihj, where Ihj is the intensity of observation j of reflection h.3R = ∑h | | Fo|−| Fc| |/∑h | Fo| for all reflections, where Fo and Fc are observed and calculated structure factors, respectively.Rfree is calculated analogously for the test reflections, randomly selected and excluded from the refinement.
创建时间：
2015-12-02
