Crystallographic data and refinement statistics.
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The values in parenthesis are for the highest resolution bin.aRsym = Rwork = ∑h∑i|Ihi- h>|/∑h∑iIhi, were Ihi is the ith observation of the reflection h, while h>is the mean intensity of reflection h.bRfactor = ∑||Fo| - |Fc||/|Fo|. Rfree was calculated with a small fraction (10%) of randomly selected reflections.cThe Rfree was calculated from 10% of all data that were not used in the refinement.
创建时间：
2015-12-02
