Our measured Cu II Stark FWHM (<em>W<sub>m</sub></em>) obtained at 19 300 K electron temperature and at 2.1 <b>×</b>
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<b>Table 1.</b> Our measured Cu II Stark FWHM (<em>W<sub>m</sub></em>) obtained at 19 300 K electron temperature and at 2.1 <b>×</b> 10<sup>23</sup> m<sup>−3</sup> electron density. Transitions and wavelengths (λ) were taken from [23] and [24]. The accuracy estimates are: 15% ≤ A ≤20% ≤ B ≤25% ≤ C ≤30%. <strong>Abstract</strong> In this work we present the Stark widths (<em>W</em>) of 22 neutral (Cu I) and 100 singly ionized (Cu II) copper spectral lines that have been measured at 18 400 K and 19 300 K electron temperatures and 6.3 <b>×</b> 10<sup> 22</sup> m<sup>−3</sup> and 2.1 <b>×</b> 10<sup> 23</sup> m<sup>−3</sup> electron densities, respectively. The experiment is conducted in the laser-induced plasma—the Nd:YAG laser, operating at 532 nm, was used to produce plasma from the copper sample in the residual air atmosphere at a pressure of 8 Pa. The electron temperature and density were estimated by the Boltzmann-plot method and from the Saha equation. The investigated Cu I lines belong to the 4s–4p', 4s<sup> 2</sup>–4p'' and 4p'–4d' transitions while Cu II spectral lines belong to the 4s–4p, 4p–5s, 4p–4d, 4p–4s<sup> 2</sup>, 4d–4f and 4d–v transitions. Comparison with existing experimental data was possible only in the case of 17 Cu II lines due to a lack of experimental and theoretical values. The rest of the data, Stark widths of 22 Cu I and 83 Cu II lines are published for the first time.
<b>表1.</b> 本研究测得的铜(II)离子(Cu II)斯塔克半高全宽(Stark FWHM),记为<em>Wₘ</em>,测试条件为电子温度19300 K、电子密度2.1×10<sup>23</sup> m<sup>−3</sup>。谱线跃迁与波长(λ)取自文献[23]与[24]。精度评定结果为:15% ≤ A ≤20% ≤ B ≤25% ≤ C ≤30%。 <strong>摘要</strong> 本工作报道了22条中性铜(Cu I)谱线与100条单电离铜(Cu II)谱线的斯塔克宽度(Stark width,W),分别在电子温度18400 K、19300 K,电子密度6.3×10<sup>22</sup> m<sup>−3</sup>与2.1×10<sup>23</sup> m<sup>−3</sup>的条件下测得。本实验基于激光诱导等离子体开展:采用工作波长为532 nm的掺钕钇铝石榴石(Nd:YAG)激光器,在8 Pa的残余空气环境中辐照铜样品以产生等离子体。电子温度与电子密度分别通过玻尔兹曼作图法(Boltzmann-plot method)与萨哈方程(Saha equation)估算得到。本次研究的Cu I谱线归属为4s–4p'、4s<sup>2</sup>–4p''以及4p'–4d'跃迁,而Cu II谱线则归属为4s–4p、4p–5s、4p–4d、4p–4s<sup>2</sup>、4d–4f及4d–v跃迁。由于缺乏相关实验与理论数据,仅可针对17条Cu II谱线与已有实验数据进行比对。剩余22条Cu I谱线与83条Cu II谱线的斯塔克宽度数据均为首次公开发表。




