XRF-Scanning elemental data 10kV of IODP Site 363-U1483

We performed high-resolution X-ray fluorescence (XRF) core scanning with the 2nd Generation Avaatech XRF Core Scanner at the Institute of Geosciences, Christian-Albrechts-University, Kiel (Germany). The archive halves were equilibrated to room temperature before scanning and a thin layer of sediment was removed from the top to obtain a fresh, even surface for scanning. We scanned at 2 cm intervals along the shipboard splice with approximately 1–2 m overlaps at splice tie points. Scanning was performed with 10 kV (750 µA, 10s acquisition time, no filter) and 30 kV (2000 µA, 20s acquisition time, Pd-thick filter) on the archive halves, which were covered with a 4 µm thick Chemplex Prolene Thin-Film foil to prevent contamination of the XRF detector. We used a crosscore slit size of 1.2 cm and a downcore slit size of 1 cm. The data reported here were acquired by a XR-100CR detector from Amptek and an Oxford Instruments 50W XTF5011 X-Ray tube with rhodium (Rh) target material. Raw X-ray spectra were converted into area counts using the iterative least-square software package WIN_AXIL from Canberra Eurisys and a core-specific model. The elements Al, Si, S, K, Ca, Ti, Mn, and Fe were analyzed with the 10-kV setting and the elements Br, Rb, and Zr with the 30-kV setting. Measured area counts per second of the spectral peaks of each element were transferred to logarithmic elemental ratios, which provide the most easily interpretable signals of relative changes in chemical composition.