Tunable Periodic Screw Dislocation Networks in Twisted SrTiO3 Thin Layers Transferred onto SrTiO3 Substrate via Wafer Bonding

Twisted perovskites represent a novel class of materials that enables a variety of fascinating novel applications in the field of nanoengineering. In the present proposal, we aim to investigate epitaxial SrTiO3 thin films that are deposited on SrTiO3 substrates by means of layer transfer and subsequent wafer bonding. The aim is to create a periodic screw dislocation network by depositing the thin films in an intentionally and controlled twisted orientation in relation to the substrate. We intend to verify and structurally investigate this dislocation network as a function of the twist angle by means of 2D grazing-incidence in-plane X-ray diffraction and 3D out-of-plane X-ray diffraction.