Crystallographic data collection and model refinement statistics for MNV NS6pro.

1Values for highest resolution shell given in parentheses.2Rmerge = 100 ×Σhkl|Ij(hkl) − j(hkl)>|/ΣhklΣjI(hkl), where Ij(hkl) and j(hkl)> are the intensity of measurement j and the mean intensity for the reflection with indices hkl, respectively.3Rwork = 100 ×Σhkl||Fobs| − |Fcalc||/Σhkl|Fobs|.4Rfree is the Rmodel calculated using a randomly selected 5% sample of reflection data that were omitted from the refinement.5RMS, root-mean-square; deviations are from the ideal geometry defined by the Engh and Huber parameters [45].