Unsupervised Machine Learning and Cepstral Analysis with 4D-STEM for Characterizing Complex Microstructures of Metallic Alloys

Raw 4D-STEM data of Ni50Ti26Hf20Al4 used for analysis in the publication "Unsupervised Machine Learning and Cepstral Analysis with 4D-STEM for Characterizing Complex Microstructures of Metallic Alloys". Datasets were collected using the electron microscope pixel array detector (EMPAD) with a Themis Z STEM. Custom python scripts used for data analysis are available upon request to one of the corresponding authors.