In situ investigation of structural change upon subjecting ferroelectric thin films to an electrical fields.

Strain in ferroelectric thin films has a pronounced effect on the functional properties of materials. The lead-free ferroelectric SrxBa1-xNb2O6 (SBN) has a flexible tetragonal tungsten bronze crystal structure which offers the tuning of its functional properties. From earlier beam times a fundamental understanding of the nucleation and growth of SBN thin films prepared by CSD has been reached. We will now conduct in situ X-ray diffraction studies on pre-made films, with different orientations and inherent strain, to identify and quantify the structural changes when exposed to an electrical field and possibly also coupled with heating above the Curie temperature. For these studies, films with both in-plane and out-of-plane polarization, and different induced strains from the substrate will be used. The data will be coupled with ex situ ferroelectric measurements of the thin films to correlate the strain, structural changes, and ferroelectric properties.