High-density deletion bin map of wheat D genome

A NimbleGen array containing both gene-based and RJM repeat junction probe sequences derived from Ae. Tauschii was developed and used to map the Chinese Spring nullisomic-tetrasomic lines and deletion bin lines of the D genome chromosomes. Overall design: The NimbleGen array was hybridized in duplicate with Cy3 labeled seven nullisomic-tetrasomic lines, deletion bin lines for D genome chromosomes, and control reference Chinese Spring; as well as Cy5 labeled reference line Chinese Spring.

一项包含基于基因和RJM重复接头探针序列的NimbleGen芯片被开发并应用于Ae. Tauschii的基因组的Chinese Spring无融合四倍体系和缺失区系染色体的图谱构建。总体设计：NimbleGen芯片与标记有Cy3的七个无融合四倍体系、D基因组染色体的缺失区系以及对照参考系Chinese Spring进行双重杂交；同时，与标记有Cy5的参考系Chinese Spring进行杂交。