Data from: Strain-induced lead-free morphotropic phase boundary

This dataset contains raw and processed experimental data supporting the
study “Strain-induced lead-free morphotropic phase boundary.” Data were
collected from NaNbO₃ thin films of varying thicknesses using techniques
such as reciprocal space mapping (RSM), high-resolution X-ray diffraction
(HRXRD), atomic force microscopy (AFM), piezoresponse force microscopy
(PFM), scanning transmission electron microscopy (STEM), X-ray
photoelectron spectroscopy (XPS), dielectric spectroscopy, and
ferroelectric measurements. Files are organized by sample ID, with
filenames indicating technique, sample thickness, date, and format. Data
formats include .csv for tabular values, .ibw for Igor Pro binary
waveforms, .pvsm and .vti for ParaView visualization states, .xrdml for
XRD raw data, and image formats (.png, .PNG). These files can be reused to
replicate the analyses presented in the associated article, enable
independent phase and domain structure studies, and support the
development of phase boundary engineering strategies in lead-free
ferroelectric thin films. The dataset is released under the Creative
Commons Zero (CC0) license and contains no personal or sensitive
information.