Dispersion relations for MAPI deposited on a Si wafer
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https://figshare.com/articles/dataset/Dispersion_relations_for_MAPI_deposited_on_a_Si_wafer/1405683/1
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Dispersion relations for MAPI deposited on a Si wafer. Measured using variable angle spectroscopic ellipsometry and fit using the following oscillators: - Tauc-Lorentz<br>Eg 1.55<br>E 0 1.63<br>A0 23.9<br>
创建时间：
2015-05-06
