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Sim and Exp Study on Response Characteristics and Damage Mechanisms of Typical Photovoltaic Systems Illuminated by HEMP

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IEEE2026-04-17 收录
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https://ieee-dataport.org/documents/sim-and-exp-study-response-characteristics-and-damage-mechanisms-typical-photovoltaic
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Coupled current waveforms at inverter #1 port PV+ for different field strengths.
提供机构:
Shiji Li
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