Test of Neutron Effects On Commercial Off The Shelf FPGA
收藏B2FIND2026-04-25 收录
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https://b2find.eudat.eu/dataset/b8e06629-0f34-58d6-a401-48e88e550b16
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The goal of these joint VESUVIO/ChipIR proposed experiments is to characterize the SEU occurrence on new generation FPGA caused by neutrons. We will focus on a Commercial...
