EIS measurements for the PrOx oxygen electrode as a function of annealing temperature
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资源简介：
Symmetric measurements of a half-cell with a 200 nm thick praseodymium oxide layer for different annealing temperatures (400 - 900°C). Measurements were taken with an excitation amplitude of 25 mV across a frequency range of 3 to 50 MHz.
提供机构：
Bartłomiej Lemieszek
