InGaN/GaN QWs on Si

Dataset for the project of high TD density QWs grown on Si, published here. The different sub-datasets are named after: the measurement technique, from [ Atomic Force Microscopy (AFM) ; Cathodoluminescence (CL) mapping ; Power-dependent photoluminescence (PL) series (P-series) ; Scanning Electron Micrographs (SEM) ; Temperature-dependent P-series (T-P-series) ; Transmission Electron Microscopy (TEM) ; Time-resolved PL (TRPL) ]; the sample name, from [ R = A4286 ; U = A4287 ; V = A4289 ]. Further relevant information can be found in the .zip folders, in README files.