Transient photocurrent test and defect detection, TCAD simulation results
收藏科学数据银行2023-08-31 更新2026-04-23 收录
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资源简介：
Using DLTS technology combined with TACD simulation experiments to detect defects in transient photocurrent test samples and explain the mechanism of current rise
提供机构：
National Space Science Center
创建时间：
2023-08-31
