Replication Data for: SRAM-Based PUF Reliability Prediction Using Cell-Imbalance Characterization in the State Space Diagram
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资源简介:
Data of the related publication. Experimental and simulation data of a 6T-SRAM used as a Physical Unclonable Function (PUF).
Experimental data is obtained starting-up each cell of a 6T-SRAM memory chip.
Simulation data is obtained from a 6T cell with the same design as the cells of the memory chip.
提供机构:
CORA.Repositori de Dades de Recerca
创建时间:
2025-01-24



