Nanoscale temperature mapping of active RF devices under transient operating conditions
收藏ESRF Portal2028-01-01 更新2026-04-23 收录
下载链接：
https://doi.esrf.fr/10.15151/ESRF-ES-2170536317
下载链接
链接失效反馈官方服务：
资源简介：
Despite urgent needs for efficient thermal solutions for next-generation radio-frequency (RF) devices for 5G/6G communications, accurate spatial and temporal temperature characterizations of these devices are lacking, hindering efforts to develop effective thermal solutions. During the proposed beamtime, we aim to further develop a novel, X-ray nano-diffraction-based thermal metrology technique to accurately characterize internal temperatures of RF devices made of crystalline multi-layers with tens of nm spatial resolution and sub-ns temporal resolution. If successful, our work will deliver, for the first time, a high-resolution internal temperature map of RF devices in situ. Subsequently, we anticipate new innovations in thermal solutions in other nanoscale electronic devices.
提供机构：
Cornell University, Dept of Materials Science & Engineering, 214 Bard Hall NY, 14853, Ithaca, USA; Cornell University , ZT Group, 354 Upson Hall, 14853 Ithaca, Usa; Cornell University, ZT Group, 354 Upson Hall, 14853, Ithaca, USA
创建时间：
2028-01-01
