Imaging the Full strain tensor around through-silicon vias: a pioneer study o...
收藏B2FIND2026-03-19 收录
下载链接:
https://b2find.eudat.eu/dataset/666cb83a-edf0-5b35-9690-c887a566864b
下载链接
链接失效反馈官方服务:
资源简介:
Through-Si vias TSVs, an elegant interconnection technique in 3D integrated microelectronics, allow for efficient use of space, providing electrical paths between layers while...



