X-Ray Fluorescence and Reflectography Data from Würzburg, Staatsarchiv Würzbu...

Name: X-Ray Fluorescence and Reflectography Data from Würzburg, Staatsarchiv Würzbu...
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B2FIND2026-04-29 收录

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XRF (Elio: 40kV, 80 µA, spot measurements of 90s each) and reflectography (DinoLite: x50 magnification, vis, NIR and UV light) analysis of inks from 45 Domkapitel...