Raw electron microscopy images for "Patchy Nanoparticles by Atomic “Stencilling” (2025)"

This dataset contains the raw transmission electron microscopy (TEM) and scanning electron microscopy (SEM) images used to calculate the synthesis yield of patchy nanoparticles (NPs), as described in Supplementary Table 1 of the paper “Patchy Nanoparticles by Atomic “Stencilling” (2025).” All the images were taken at the Materials Research Laboratory, University of Illinois at Urbana-Champaign by Qian Chen group.

1. We have 21 subfolders, each with a name corresponding to one of the 21 patchy NPs listed in Supplementary Table 1 of the paper “Patchy Nanoparticles by Atomic “Stencilling” (2025)."
2. In TEM images, the bright and dark regions indicate the polymer patches and NP cores, respectively.
3. In SEM images, the bright and dark regions indicate the NP cores and polymer patches, respectively.
4. Each subfolder contains a “readme (subfolder name).txt” file with more detailed information about each sample.