XRD data of ZnO-nanostructure
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https://figshare.com/articles/dataset/XRD_data_of_ZnO-nanostructure/19603879/1
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资源简介：
X-ray diffraction (XRD) was used to determine the crystalline structure and grain sizes of the synthesized ZnO NPs. The intensity data were recorded over a 2θ range of 10−60<sup>o</sup>. The strongest diffraction peaks observed at 2θ values of 31.92°, 34.62°, 36.44°, 47.74°, and 56.76° have been indexed as (100), (002), (101), (110) and (103) crystal planes of ZnO, respectively.
提供机构：
figshare
创建时间：
2022-04-15
