EBSD measurements of Surfalex HF (AA6016A)

This dataset contains electron back scatter diffraction (EBSD) measurements of Surfalex HF (AA6016A), an aluminium alloy commonly used in automotive applications.

The measurements were carried out using an FEI Sirion field emission gun scanning electron microscope equipped with a Nordlys detector from Oxford instruments. An acceleration voltage of 20 kV was used to scan large areas with a working distance of 16 mm and a step size of 2 μm. The size of the areas ensured that a sufficient number of grains were captured in order to have a reliable estimate of texture.

EBSD scans were performed on three different planes with respect to the rolling (RD), transverse (TD) and normal (RD) directions: RD-TD, RD-ND and TD-ND.

The sample preparation for EBSD involved grinding steps from 600 to 4000 grit, followed by 3 μm and 1 μm diamond polishing. The final stage of polishing was performed using a colloidal silica with a particle size of 0.02 μm. In order to increase the surface quality, the samples were then subjected to electropolishing using a solution of 70% methanol and 30% nitric acid. The electrolyte was maintained at -15 Celsius during the entire process. The polishing voltage was 10 V and the polishing time was 10 s.