Sentaurus TCAD
收藏DataCite Commons2025-02-28 更新2025-04-16 收录
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https://ieee-dataport.org/documents/sentaurus-tcad
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This dataset contains input parameters, output I-V characteristics, and simulation command files related to TCAD (Technology Computer-Aided Design) simulations. The data includes structured experiment lists, extracted electrical parameters, and script files used for simulation and visualization. The dataset is organized into subdirectories containing Evenfinger and Oddfinger simulation setups, along with associated design and analysis files. The included Excel files document input conditions and resulting electrical characteristics, while the Tcl scripts provide details on device modeling. This dataset is intended for researchers and engineers working on semiconductor device simulations, process optimization, and reliability analysis. It enables reproducibility of experiments and facilitates further exploration of advanced device modeling techniques.
本数据集包含与TCAD(Technology Computer-Aided Design,工艺计算机辅助设计)仿真相关的输入参数、输出I-V特性曲线以及仿真命令文件。数据集涵盖结构化实验列表、提取的电学参数,以及用于仿真与可视化的脚本文件。本数据集按子目录组织,包含偶数叉指(Evenfinger)与奇数叉指(Oddfinger)仿真配置,以及相关的设计与分析文件。所包含的Excel文件记录了输入条件与最终得到的电学特性,而Tcl(Tool Command Language,工具命令语言)脚本则详细说明了器件建模的相关内容。本数据集面向从事半导体器件仿真、工艺优化与可靠性分析的研究人员与工程师。其可保障实验的可复现性,并助力先进器件建模技术的进一步探索。
提供机构:
IEEE DataPort创建时间:
2025-02-28
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以上内容由遇见数据集搜集并总结生成



