Scanning electron microscopy (SEM) images of the boron-dopied carbon nanowalls surfaces
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资源简介：
The dataset contains the scanning electron micrographs (SEM), revealing the surface morphology of boron-doped carbon nanowalls electrodes on silicon substrates. The surface is characterized by nano-walled structures. The obtained electrodes were doped with boron at the level of [B]/[C] = 1200ppm in the gas atmosphere during the synthesis.
The selected micrographs were utilized when preparing the manuscript published in Advanced Materials Interfaces: DOI 10.1002/admi.202100464
提供机构：
Gdańsk University of Technology
创建时间：
2022-07-29
