Scan-Coil Delay Causes Anisotropic Signal Loss in Fast 4D-STEM

This dataset accompanies the study "Scan-Coil Delay Causes Anisotropic Signal Loss in Fast 4D-STEM" (Kumar V. et al.). It provides the raw four-dimensional scanning transmission electron microscopy (4D-STEM) data and the real-space probe-motion measurements used to characterize and correct the intra-dwell scan-coil delay that smears the recorded signal along the scan direction at high scan speeds. The deposit is organized into two parts. The 4D-STEM data comprises a focused dataset used for integrated centre-of-mass (iCoM) and virtual dark-field (vDF) reconstructions, a defocused probe series acquired at four step sizes (0.91, 1.285, 2.525, and 5.025 Å), all recorded at EPFL on a Dectris ARINA detector, together with a separate defocused dataset acquired at LMU Munich on a TimePix4 detector. The Real-space data contains direct measurements of the STEM probe motion in real space.