Read noise based generation of true random numbers in soft and hardware
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Data set containing both the read noise of tantalum oxide based ReRAM devices and true random numbers which are generated based on this physical entropy source. The dataset contains two parts. The one part is the read noise of ReRAM devices which first were switched two times and then read for two seconds. The devices were read at 0.2 V with a sampling rate of 8 ksamples per second. This data can be found in the subfolder Read_noise. The other part are random numbers which were generated by software and by hardware simulation. More details about the way the TRNG were generated can be found in the publication linked to this data publication.
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IEEE DataPort创建时间：
2024-08-05
