Data for "Denoising Atomic Resolution 4D Scanning Transmission Electron Microscopy Data with Tensor Singular Value Decomposition"
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Data for "Denoising Atomic Resolution 4D Scanning Transmission Electron Microscopy Data with Tensor Singular Value Decomposition" by Chenyu Zhang, Rungang Han, Anru R. Zhang, Paul. M. Voyles. Consists of experimental and simulated 4D STEM data both as-created and after denoising with tensor singular value decomposition. Simulated data sets are from SrTiO<sub>3</sub> [100] and an edge dislocation in Si [110]. Experimental data sets are from SrTiO<sub>3</sub> [100] and an epitaxial LiZnSb thin film on GaSb substrate. MATLAB code for tensor SVD denoising is also included.
创建时间：
2020-07-04
