In situ GIXRD of organic thin films during tensile deformation for applications in stretchable electronics

We seek to investigate, simultaneously: (a) the microstructural changes that occur when an organic semiconductor (OSC) thin film device is mechanically stretched; (b) the changes in the electrical performance of the device This experiment aims to understand how the structural changes correlate with changing device performance. We will install a tensile test stage, as seen in Fig. 1, at the BM28 beamline to enable in operando characterization in grazing incidence geometry. These investigations relate to the field of stretchable electronics and will be of high interest to the organic electronics community.